HD-1射线光谱仪
产品介绍：采用柱状晶体和CCD线阵探测器， 研制了HD-1 x射线聚焦晶体von Hamos光谱仪。特殊的聚焦几何形状用于记录非常低强度的x射线辐射。主要特点◆ 聚焦集合提供极高的探测效率◆ 可提供绝对强度校准◆ 紧凑的尺寸◆ 无须更换晶体◆ 最佳探测范围：0.6-1.4nm
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产品介绍：
采用柱状晶体和CCD线阵探测器， 研制了HD-1 x射线聚焦晶体von Hamos光谱仪。特殊的聚焦几何形状用于记录非常低强度的x射线辐射。
主要特点
◆ 聚焦集合提供极高的探测效率
◆ 可提供绝对强度校准
◆ 紧凑的尺寸
◆ 无须更换晶体
◆ 最佳探测范围：0.6-1.4nm
HD-1 X射线光谱仪 datasheet 2022.4.24pdf.pdf
发表文章：
1. A.P. Shevelko, D.E. Bliss, E.D. Kazakov, M.G. Mazarakis, J.S. McGarn, L.V. Knight, K.W. Struve, I.Yu. Tolstikhina, T.J. Weeks. “EUV spectroscopy of plasmas created in the final anode-cathode gap of the Z-Machine high-current pulsed generator (SNL).” Plasma Physics Report 34 (11), 944-954 (2008).
2. M.S. Bibishkin, E.D. Kazakov, V.I. Luchin, N.N. Salashchenko, V.V. Chernov, N.I. Chkhalo, A.P. Shevelko. “New focusing multilayer strustures for x-ray plasma spectroscopy.” Quantum Electronics 38, 169 (2008).
3. A.Ya. Lopatin, V.I. Luchin, N.N. Salashchenko, N.I. Chkhalo, A.P. Shevelko, O.F. Yakushev. “New focusing multilayer structures for x-ray and VUV plasma spectroscopy.” Technical Physics 55 (7), 1018-1023 (2010).
4. Yu.E. Borozdin, E.D. Kazakov, V.I. Luchin, N.N. Salashchenko, I.Yu. Tolstikhina, V.V. Chernov, N.I. Chkhalo, A.P. Shevelko, O.F. Yakushev. “X-ray and Vacuum-Ultraviolet Plasma Spectroscopy with the Use of New Focusing Multilayer Structures.” JETP Lett. 87, 27-29 (2008).
5. M.B. Agranat, N.E. Andreev, S.I. Ashitkov, A.V. Ovchinnikov, D.S. Sitnikov, V.E. Fortov, A.P. Shevelko. “Generation of characteristic X rays by a terawatt femtosecond chromium-forsterite laser.” JETP Lett. 83 (2), 80-83 (2006).
6. Weeks, M. Harrison, M. Johnson, A. P. Shevelko, J. Ellsworth, S. Bergeson, M. Asplund, L. V. Knight. “Absolute soft x-ray calibration of laser produced plasmas using a focusing crystal von Hamos spectrometer.” SPIE 5918, OR 1-10 (2005).
7. M.B. Agranat, N.E. Andreev, S.I. Ashitkov, E. Boyle, V.E. Fortov, L.V. Knight, A.V.Ovchinnikov, A.P. Shevelko, D.S. “Generation of hard x-rays by a forsterite terawatt laser.” SPIE 5918, 0O 1-10 (2005).
8. А.P. Shevelko, L.V. Knight, J. Phillips, R.S. Turley, C. Turner, O.F. Yakushev. “X-ray and EUV spectral instruments for plasma source characterization.” SPIE5196, 282-288 (2003).
9. P. Shevelko, Yu.S. Kasyanov, O.F. Yakushev, L.V. Knight. “Compact focusing von Hamos spectrometer for quantitative x-ray spectroscopy.” Rev. Sci, Instrum.73 (10), 3458-3463 (2002).
10. Shevelko, A. Antonov, I. Grigorieva, Yu. Kasyanov, O.Yakushev, L. Knight, Q. Wang. “X-ray focusing crystal von Hamos spectrometer with a CCD linear array as a detector.” Adv. X–ray analysis 45, 433-440 (2001).
11. P. Shevelko, L.V. Knight, Q. Wang, O.F. Yakushev. “Absolute x-ray calibration of laser-produced plasmas using a CCD linear array and a focusing crystal spectrometer.” SPIE 4504, 215-226 (2001).
12. C. Turner, L.V. Knight, A. Reyes-Mena, P.W. Moody, H.K. Pew, J.D. Phillips, A.P. Shevelko, S. Voronov, O.F. Yakushev. “Focusing crystal von Hamos spectrometers for XRF applications.” Adv. X-ray analysis 44, 329-335 (2000).
13. P. Shevelko, A.A. Antonov, I.G. Grigorieva, Yu.S. Kasyanov, L.V. Knight, A. Reyes-Mena, C. Turner, Q. Wang, O.F. Yakushev. “A Focusing Crystal von Hamos Spectrometer for X-ray Spectroscopy and X-ray Fluorescence Applications.” SPIE 4144, 148-154 (2000).