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hardLIGHT TXS tender x-ray spectrometer

hardLIGHT TXS tender x-ray spectrometer

Company BriefHP Spectroscopy, founded in 2012, is a leading developer and global supplier of scientific instrumentation.The product lines include spectroscopy tools, detector solutions, and beamline i

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Company Brief

HP Spectroscopy, founded in 2012, is a leading developer and global supplier of scientific instrumentation.

The product lines include spectroscopy tools, detector solutions, and beamline instrumentation. HP Spectroscopy deliver cutting-edge products to customers in academia and industry worldwide. HP take pride in the customization of all our products to deliver the best solution for each application.

HP Spectroscopy's team consists of experts in the fields of spectroscopy, grating design, plasma physics, beamline technology, and X-ray technology, as well as mechanical, electronics, and software engineers. At HP, they combine over 70 years of expertise in spectroscopy.

Introduction

hardLIGHT TXS tender x-ray spectrometer

  • single-shot diagnostics at 2 to 4 keV

  • backscattering mode for online beam characterization

  • XES mode for investigating material samples

  • energy resolution of 0.3eV

  • compact and mobile device

The TXS spectrometer enables accurate photon diagnostics at HHG beamlines, X-ray free-electron lasers, and table-top X-ray lasers. Photon energies between 2 keV and 4 keV can be measured in single-shot.

In von Hamos geometry with high-efficiency backscattering, the X-ray spectrum is fingerprinted for online beam characterization. The transmitted beam remains undisturbed with >90% transmission for further use in experiments.

By simply exchanging the backscattering probe with a material sample, the hardLIGHT TXS is made ready for X-ray emission spectroscopy (XES). The tender X-ray range provides sensitive access to the chemical state of many materials, e.g. investigations of sulfur at 2keV allow for important insights for battery research.

Customized derivatives of the TXS spectrometer are also available. Contact us to discuss your application.

Results

X-ray absorption spectroscopy (XAS) at the sulfur K-edge

(data courtesy of Dr. W. Malzer, TU Berlin)

Applications

  • photon diagnostics at HHG beamlines,

  • X-ray free-electron lasers, table-top X-ray lasers

  • in-situ XES measurements

Downloads

北京众星联恒科技有限公司HP-Spectroscopy_nanoLIGHT集成式XUV光谱仪和光束分析仪_datasheet_2021-5-19.pdf