Micro-Nano Ultra Precision Machining
TOP-UNISTAR(HK) SCIENCE & TECHNOLOGY CO., LTD.
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Product
ALL
System
Table-top XAS system
FemtoX-II
X-Ray Talbot-Lau Interferometer
X-ray CT scanner
X-ray solution for Synchrotron users
X-ray solution for Semiconductor and MEMS
turn-key HHG beamlines
Source
Microfocus XRD
Microfocus XRF
Microfocus X-ray source-detector calibrant
Optics
Nanostructured-optics
EUV Replicated Optics
X-ray CRL lens
X-ray resolution target
X-ray beamstops
X-ray apertures
X-ray grating sets
Multilayer Mirror
Polycapillary Optics
Scatterfree Pinhole
Detector
EUV/X-ray Xpin detecter
Indirect detection X-ray camera
CCD Camera for EUV/SXR/X-RAY
HPC Detector for X-RAY
BrillianSe™ X-ray Detector
Full frame Camera
Spectrometer
Mass Spectrometer
GDMS
Solutions
ALL
X ray source upgrade
Knowledge
ALL
X ray detector
X ray optics
X ray source
X ray analytical method
Micro-Nano Ultra Precision Machining
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Micro-Nano Ultra Precision Machining
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