The GD90 Trace, the GDMS instrument from MSI, features a proven optical platform with innovative modern stable electronics and control. All voltages are under computer control providing unsurpassed ease of use with a simple USB interface to the control, acquisition and processing PC. Remote control of the instrument and hardware control of acquisition are also incorporated.

Advantages of GDMS

Full elemental analysis of major (wt%) to ultra-trace elements (ppb to sub-ppb) within a single scan
Direct solid sampling technique, thus alleviating the need for chemical digestion
Continuously variable high resolution capabilities from<400 to="">10,000 RP (10% valley definition)
Dual collectors allowing up to 12 orders of linear dynamic range
A proven technique for high sensitivity depth-dependent distribution analysis of trace elements in coatings and other multi-layered advanced materials
Minimal matrix effects allow calibration without matrix matched standards by using Relative Sensitivity Factors (RSF)

Features of the GD90 Trace

Tantalum cell and source construction for ease of cleaning
Availability of cryo-cooling of the GD cell to minimise gas backgrounds
Accommodates both pin and flat cell geometries
No mass bias for light/heavy elements
Calibration consists of a quick check of 180Ta and 181Ta to ensure that the IC and Faraday detectors are in agreement
Low gas flow allows for cost-effective use of an alternate ionisation gas such as krypton
Ability to analyse a wide range of samples ranging from alloys to high purity materials (both conductive and non-conductive), in a plethora of sample geometries
Low sputter rate – at normal analytical conditions the sputter rate ranges from 150 nm/minute (conductive) to 100 nm/minute (non-conductive); lowering operational conditions allows sputter rate to be slowed by at least 5x
RSFs and Detection Limit determinations are derived from published, readily sourced methods
Front end assembly allows for the fitting of a custom-designed glove box for nuclear applications

GD90 Trace Applications

Glow discharge mass spectrometry (GDMS) is a mature, versatile technique for the direct determination of elemental content (matrix to sub-trace) in a variety of materials. The GD90 Trace from MSI is capable of many different types of analyses, and can accommodate just about any sample purity, matrix and geometry.

GDMS Analyses

GDMS analyses

Sample Types

All types of materials can be analysed, from alloys to >9N. The samples that we analyse on the GD90 are typically pins 2mm x 2mm x 20mm (or ∼3mm ø x 20mm) or flat blocks ∼15mm x ∼15mm x >1mm, but many other types of sample geometries can be accommodated by mounting them on a secondary binder. Some examples of irregular type samples which can be analysed are:

granular powders
fine powders
thin foils (<1µm)

wafers
shot pellets
waste products

screws
wires
chips

filings
turnings
shards

Oxides and other non-conductive materials can be analysed in direct current mode (DC) by mounting them on a secondary conductive binder, typically indium. Generally, this is a simple, quick procedure which can be done manually. Additionally due to cryo-cooling of the GD cell, low melting point materials such as tin (Sn), antimony (Sb), indium (In) and gallium (Ga) can be analysed.

About MSI

Mass Spectrometry Instruments Ltd (MSI) is a small, privately owned company specialising in high performance magnetic sector double focusing mass spectrometers designed to meet the needs of both the organic and inorganic analysis markets. It has inherited the technology from Kratos Analytical who were the pioneer in introducing commercial sector mass spectrometers back in 1957. Since then the need for high precision, high resolution instruments has risen exponentially. At MSI we are making great strides in taking this technology to the next level by investing in new developments and applications.