XOS fleX-Beam
Features and Benefits• fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators• Focal spot as small as 5µm @ Rh Ka (20.162keV)• 50 watt performance exceeds convention
- Model: FLEX-BEAMS
Features and Benefits• fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators• Focal spot as small as 5µm @ Rh Ka (20.162keV)• 50 watt performance exceeds convention
fleX-Beam is a unique, compact X-ray generator that combines a low-powered X-ray source and a precisely aligned polycapillary optic to deliver a bright X-ray beam for advanced material analysis. It provides the turn-key solution for the end-users and ensures the X-ray optics' optimal performance. The innovative design allows seamless x-ray tube replacement and on-site optic alignment. The products have been widely used in commercial instruments for plating thickness measurement, thin-film characterizations, molecular structure analysis, and many other applications.
fleX-Beam is available in several standard focused or collimated beam configurations and can also be customized for specific applications.
• fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators
• Focal spot as small as 5µm @ Rh Ka (20.162keV)
• 50 watt performance exceeds conventional kilowatt-powered X-ray tubes
• Integrated safety shutter & 8-position filter wheel
fleX-Beam™ can be used in different applications where a compact X-ray source with high photon flux is required. Various configurations are available to be used in μ-XRF, diffraction, in-line process monitoring or in-situ analysis, and medical imaging applications. XOS provides custom fleX-Beam optics based on customer requirements.
• Innovative design allows for the ability to interchange different optics, as well as service the X-ray source in the field
• Small Feature Analysis
• Film & Plating Thickness
• High-Resolution Elemental Mapping
• Gun residue study in forensics
• Pigment study in art preservation
• Composition and artifact analysis in archaeology
• Residual Stress Analysis
• Laue Diffraction
• Powder Diffraction